Class Space is Limited
May 21-22
VIRTUAL EXPERIENCE
1 - 4:30pm CEST (GMT+2)
7 - 10:30am EDT (GMT-4)
Presented by Alex T. Lau
Overview of the normal distribution and standard deviation concepts
Repeatability, reproducibility, and Site (system) Precision
Various forms of Bias
Site Expected Value (SEV) & Accepted Reference Value (ARV)
Bias assessment for a laboratory
Alex T. Lau, President of TCL-Consulting and Chairman of ASTM D02.94 Subcommittee on Quality Assurance and Statistics, to present his Introductory Training Course on Understanding Test Method Precision, Bias, and SQC Charts. The virtual class will be in the format of two 90 minutes sessions per day over two days.
Daily sessions: 1 PM - 2:30; 3 - 4:30 PM CEST (GMT+2) | 7 AM - 8:30; 9 - 10:30 AM EDT (GMT-4); with a 30 minute break between each session.
Precision Fundamentals
- Overview of the Normal distribution and standard deviation concepts
- Provide simple explanation on the meaning of test method repeatability (r), reproducibility (R), and site (system) precision (R')
- How r & R are estimated using ILS
- How r & R information is presented in test methods
- Simple applications of r, R, R'
Bias Fundamentals
- Various forms of Bias
- Site Expected Value (SEV) & Accepted Reference Value (ARV)
- Bias assessment for a laboratory
In-Statistical-Control Fundamentals
- Basic statistical theory, concept, and work process for test method statistical control charts
- Demo of control chart work process execution (Stage 1,2) using QC/PLUS
Who should attend?
- Lab technicians
- Lab QA/QC personnel
- Lab managers
- Personnel involved with product quality assurance and regulatory compliance testing
To register, click here.
Cost is $0 per person.
For more information, email This email address is being protected from spambots. You need JavaScript enabled to view it.